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100mil ICT test probe SF-PA1.65 BY 32.3-LM2.0
- Item: 100mil ICT test probe SF-PA1.65 BY 32.3-LM2.0
- Plunger material: BeCu, Gold plating over nickel,
- Barrel material: Brass, Gold plating over nickel,
- Spring material: SWP, Gold plating over nickel,
- Current ration:5A,
- Spring force: 350g ±50g @ load 4.0mm rated stroke,
- Full stroke:5.30mm,
- Packaging: plastic bag and standard carton,
- Lead time: about 7-15 days if no stock,
100mil ICT test probe SF-PA1.65 BY 32.3-LM2.0
Specifications
Brand |
SFENG |
Model |
SF-PA1.65X32.3-LM2.0 |
Plunger |
BeCu |
Body |
Brass |
Spring |
SWP |
Spring force |
350g±50g |
Working travel |
4.0mm |
Plated |
Gold plated |
Contact Resistance |
50mΩ |
Current Ration |
5A |
Full Stroke |
5.30mm |
MOQ |
1000 |
Lead Time |
7-15 Days after confirming order |
Customized probe pin Image
Customized probe pin drawing
our service
1. Quick response.
2. Customized is accepted.
3. Short production time and fast delivery.
4. High quality and good price.
Main products
Spring-loaded pin (single) of PCB, ICT, FCT testing;
Spring pin (connector) to establish a connection between two printed circuit boards for charging, positioning, batteries, semiconductors and amplifiers; interconnect applications;
BGA and semiconductor test double-ended probe;
Universal pin no spring, paint needle, LM pin QZ and VZ series;
High current probe, the probe switches, capacitors needle;
Pier and amplifier; socket / socket;
Other related electronic components, 30 # OK line, jig lock, POM, iron hinges, etc.
Production process
Testing equipment
Packing & delivery