2026 Free Sample Spring Test Probe Contact Pin

Pogo pins are spring-loaded contact pins that provide temporary electrical connections between devices. They consist of a plunger, spring, and barrel, designed to compress and maintain consistent contact under mechanical pressure
In tablets, they are often integrated into ports, docking stations, or modular accessories to facilitate data transfer, charging, and peripheral connectivity.

A pogo pin (spring-loaded pin) is a type of electrical connector mechanism featuring a plunger, barrel, and spring that creates reliable, durable connections by maintaining constant, spring-loaded contact. Widely used in electronics for charging, data transfer, and testing, they offer high durability, low-profile, and vibration resistance.

Sample order ship by DHL, UPS, FedEx, TNT, EMS etc.

For mass order delivery, can be optional with terms of Exwork, FOB, CNF, CIF by air or by sea based on the buyer’s forwarder or ours.

1.What is terms of SFENG payment?

For the orders, we prefer 100% payment before the delivery. You can choose Wire transfer, Pay Pal. USD dollar, Japanese Yuan and RMB are accepted.

2.Does SFENG provide free samples?

Yes, SFENG are pleased to provide free samples for testing before orders. It’s the biggest things that you trust us and our product quality.

3.What is the lead time of orders?

SFENG can send the goods out within 3 days after receiving the order. For customized products, we will adjust the lead time accordingly.

4.What is your QC process?

SFENG have skilled QC team and professional testing equipment. From the raw material to the finished products, we will make the testing. Only appearance, dimension, tips, spring force, plating and life span are checked ok by professional equipment. the goods can be sent to customers.

5.Can customized products be accepted?

Yes, one of our main features is customization. Just providing the drawing, we will make the product specially for you.

6.What test probes can SFENG provide?

SFENG can mainly provide 5 kinds of test probes, including in-circuit test probe, semiconductor test probes, battery contact pins, guide pins and related accessories.