Test probes are one of the important tools for testing the performance of electronic components, circuit boards and systems. (battery pin for charging switch) According to different test requirements and application scenarios, test probes can be divided into four types: reflective test probes, refractive test probes, inductive test probes and multi-channel test probes. This article will introduce the characteristics and application scenarios of these four test probes.

1. Reflective test probe

A reflective test probe is a commonly used test probe that detects defects or changes in geometry by contacting the surface of the object being tested. Reflective test probes are characterized by their simplicity and ease of use, and can quickly detect surface defects such as scratches, pits, oxidation, etc. The application scenarios of reflective test probes include circuit board inspection, component inspection, surface mount inspection, etc.

2. Refraction test probe

Refractive test probes contact the surface of the object being tested and sense its internal defects.(female male spring loaded connector pogo pin) It uses the principle of light refraction to detect defects inside objects, such as cracks, bubbles, etc. The characteristic of the refractive test probe is that it has high sensitivity and can detect tiny defects. At the same time, it does not have many requirements on the surface of the object being tested. The application scenarios of refractive test probes include semiconductor testing, optical component testing, glass testing, etc.

3. Inductive test probe

Inductive test probes generate magnetic fields or electric fields around the object being tested, and use changes in the induction signal to detect defects or changes in geometry within the object. The characteristic of the inductive test probe is that it can detect defects inside the object non-contactly, and at the same time, there are not many requirements on the material and shape of the object being tested. The application scenarios of inductive test probes include transformer detection, inductor detection, coil detection, etc.

4. Multi-channel test probe

A multi-channel test probe is a test probe that can detect multiple points at the same time. (micro pogo pin connector supplier china) It detects multiple positions of the measured object through multiple channels at the same time to improve detection efficiency and accuracy. Multi-channel test probes are characterized by fast detection speed and high accuracy, while reducing detection time and workload. The application scenarios of multi-channel test probes include circuit board inspection, component inspection, wafer inspection, etc.

To sum up, the four test probes have their own characteristics and application scenarios. According to different testing needs and application scenarios, you can choose the appropriate test probe for detection. When selecting a test probe, factors such as the material, shape, size, defect type, and detection accuracy of the object to be tested need to be considered.