International standard spring-loaded test probes for In-circuit test

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International standard spring-loaded test probes for In-circuit test

Plunger material:Becu or brass,gold plating
Barrel material:brass,gold plating
Spring:SUS,music wire
Packing:100pcs in one polybag

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International standard spring-loaded test probes for In-circuit test

During in-circuit tests(ICT) all components on the PCB are measured.So defective components are detected and can be replaced accordingly.

In-circuit test probe pin are used for testing the electrical performance if in-circuit components on PCB and the connection betweeen circuit networks.It could measure the components,such as resistors,capacitors,inductors,and perform functional tests of optocouplers,transformers,operational amplifiers,power supply modules and integrated circuits.

SF-P11 series test probe pin

SF-P111 series test probe pin

SF-P100 series test probe pin

Suzhou Shengteng Electronic Co.,Ltd is the leading manufacturer of test probe pin in China.In 1984 we set up the first factory in Cixi city,we have been specialized in pogo pin,Bare PCB test probes,In-circuit test probes,high current test probes,and semiconductor test probes for more than 30years.With the advantages of advanced equipment and strict inspection process,our products see well in Europe,North America and Southeast Asia.In the future,we will keep on working hard with the dream of the China's and the Worlds.

Looking forward to cooperating with you.

Hot Tags : China spring pogo pin supplier China test probe supplier China spring probe supplier semiconductor testing Printed Circuit Board Testing

Suzhou Shengyifurui Electronic Technology Co., Ltd

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Address: Room 1411, Building A, Jinfeng Advertising Industrial Park, No. 646 Yushan Road, Suzhou City, Jiangsu Province, China
Postcode: 215101
Phone: 0086-512-68051148
Mobile: 008613771901136
Email: leoxu@sf-probe.com

International standard spring-loaded test probes for In-circuit test

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International standard spring-loaded test probes for In-circuit test

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