standard size spring test probe for ICT FCT contacts
Suzhou Shengteng Electronic Co.Ltd is mainly produce spring test probe for PCB,ICT and FCT test.The most common test mothods in the quality inspection of electronic assemblies are the In-Circuit Test (ICT), and the Functional Test (FCT).
About the ICT/FCT contacts the most common designs of test probes are shown as below. Most of them are compatible with other brands on the international market. If you didn't find the suitable size for you, please just call us - we assist you in direct consultation.
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