100mil ICT test probe SF-PA1.65 BY 32.3-LM2.0

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100mil ICT test probe SF-PA1.65 BY 32.3-LM2.0

Item: 100mil ICT test probe SF-PA1.65 BY 32.3-LM2.0

Plunger material: BeCu, Gold plating over nickel,

Barrel material: Brass, Gold plating over nickel,

Spring material: SWP, Gold plating over nickel,

Current ration:5A,

Spring force: 350g ±50g @ load 4.0mm rated stroke,

Full stroke:5.30mm,

Packaging: plastic bag and standard carton,

Lead time: about 7-15 days if no stock,

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Product Details

100mil ICT test probe SF-PA1.65 BY 32.3-LM2.0

Specifications

Brand	SFENG
Model	SF-PA1.65X32.3-LM2.0
Plunger	BeCu
Body	Brass
Spring	SWP
Spring force	350g±50g
Working travel	4.0mm
Plated	Gold plated
Contact Resistance	50mΩ
Current Ration	5A
Full Stroke	5.30mm
MOQ	1000
Lead Time	7-15 Days after confirming order

Customized probe pin Image

Customized probe pin drawing

our service

1. Quick response.

2. Customized is accepted.

3. Short production time and fast delivery.

4. High quality and good price.

Main products

Spring-loaded pin (single) of PCB, ICT, FCT testing;

Spring pin (connector) to establish a connection between two printed circuit boards for charging, positioning, batteries, semiconductors and amplifiers; interconnect applications;

BGA and semiconductor test double-ended probe;

Universal pin no spring, paint needle, LM pin QZ and VZ series;

High current probe, the probe switches, capacitors needle;

Pier and amplifier; socket / socket;

Other related electronic components, 30 # OK line, jig lock, POM, iron hinges, etc.

Production process